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Applicability of X-ray microtomography for Characterizing the Microstructure of Frozen Apple during Storage
Vicent, Victor; Ndoye, Fatou-Toutie; Verboven, Pieter; Nicolaï, Bart; Alvarez, G.
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4th IIR Conference on Sustainability and the Cold Chain location:Auckland, New Zealand date:6-7 April 2016
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