| dc.creator |
Koleleni, Yusuf I. A. |
|
| dc.creator |
Kondoro, John W. |
|
| dc.date |
2016-06-03T13:48:02Z |
|
| dc.date |
2016-06-03T13:48:02Z |
|
| dc.date |
1999 |
|
| dc.date.accessioned |
2018-03-27T09:01:15Z |
|
| dc.date.available |
2018-03-27T09:01:15Z |
|
| dc.identifier |
Koleleni, Y.I.A. and Kondoro, J.W.A., 1999. Precision measurements with the total reflection x-ray fluorescence system in Dar es Salaam. SINET: Ethiopian Journal of Science, 22(1), pp.141-146. |
|
| dc.identifier |
http://hdl.handle.net/20.500.11810/2387 |
|
| dc.identifier |
10.4314/sinet.v22i1.18139 |
|
| dc.identifier.uri |
http://hdl.handle.net/20.500.11810/2387 |
|
| dc.language |
en |
|
| dc.title |
Precision Measurements with the Total Reflection X-Ray Fluorescence System in Dar es Salaam |
|
| dc.type |
Journal Article, Peer Reviewed |
|