A variable control chart based on process capability index under generalized multiple dependent state sampling

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Institute of Electrical and Electronics Engineers

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Abstract. Full text article available at https://doi.org/10.1109/ACCESS.2019.2903892
This paper proposed a process capability index-based control chart under the new extended form of multiple-dependent state sampling (MDS) named generalized MDS (GMDS). The scheme is based on inner and outer control limits and utilizes the previous state of the samples. The performance comparisons of the proposed chart with the existing charts are made by using out-of-control ARL. The simulation study showed the superiority of the proposed chart over the existing PCI-based control charts under Shewhart and MDS schemes. An empirical illustration is also given to demonstrate the application of the proposed chart.

Keywords

Control charts, Capability indice, Quality control, Sampling plans, Simulation, Process Capability Index, PCI, Multiple-Dependent State sampling, MDS, GMDS, Variable Control Chart

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