A variable sampling plan using generalized multiple dependent state based on a one-sided process capability index

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Abstract. Full text is available at https://doi.org/10.1080/03610918.2019.1612431
In this manuscript, a sampling plan based on one-sided process capability index is designed using the generalized multiple dependent state (GMDS) sampling. The operating characteristic function is developed using the exact distribution of the estimated PCI. The plan parameters of the proposed sampling plans are determined through the non-linear optimization problem at specified producer’s risk and consumer’s risk. An example is reported with the help of real data from the industry. The efficiency of the proposed sampling plan is compared with the existing multiple dependent state (MDS) sampling in terms of sample size.

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Inspection, Lot sentencing, Risk, Multiple dependent state, GMDS, Process Capability Index, PCI, Average sample number, Generalized multiple dependent state

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