Bootstrap confidence intervals of CNpk for exponentiated Fréchet distribution
No Thumbnail Available
Date
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Springer Nature
Abstract
Description
Abstract, Full text article is available at: https://doi.org/10.1007/s41872-018-0069-1
Confidence intervals for process capability index using bootstrap method (Chen and Pearn, Qual Reliab Eng Int 13(6), 355–360, 1997) are constructed through simulation assuming that the underlying distribution is exponentiated Fréchet distribution (EFD). Parameters are estimated by Maximum likelihood (ML) method. Also obtain the estimated coverage probabilities and average widths of the bootstrap confidence intervals through Monte Carlo simulation. Illustrate the process capability indices for EFD using some numerical examples.
Confidence intervals for process capability index using bootstrap method (Chen and Pearn, Qual Reliab Eng Int 13(6), 355–360, 1997) are constructed through simulation assuming that the underlying distribution is exponentiated Fréchet distribution (EFD). Parameters are estimated by Maximum likelihood (ML) method. Also obtain the estimated coverage probabilities and average widths of the bootstrap confidence intervals through Monte Carlo simulation. Illustrate the process capability indices for EFD using some numerical examples.
Keywords
Exponentiated Fréchet distribution, EFD, Process capability index, Bootstrap confidence interval, Maximum likelihood estimation, Monte Carlo simulation, Boostrap, CNpk