One-sided cumulative sum (CUSUM) control charts for the Erlang-truncated exponential distribution

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dc.creatorRao, G. S
dc.date2020-11-25T07:41:59Z
dc.date2020-11-25T07:41:59Z
dc.date2013
dc.date.accessioned2022-10-20T13:09:18Z
dc.date.available2022-10-20T13:09:18Z
dc.descriptionAbstract. Full text available at https://yadda.icm.edu.pl/baztech/element/bwmeta1.element.baztech-1b063a7c-5611-41ce-ad89-4db3568825cf
dc.descriptionIn this article, we construct one-sided cumulative sum (CUSUM) control charts for controlling the parameters of a random variable with erlang-truncated exponential distribution. The rejection of the Wald’s sequential probability ratio test (SPRT) is viewed as the decision lines of a CUSUM control chart for which the variate is a quality characteristic. Parameters of the CUSUM chart, e.g. lead distance and mask angle, are presented. The results show that the Average Run Length (ARL) of the resulting control charts changes substantially for a slight shift in the parameters of the distribution.
dc.identifierRao, G. S. (2013). One-sided cumulative sum (CUSUM) control charts for the Erlang-truncated exponential distribution. Computational Methods in Science and Technology, 19(4), 229-234.
dc.identifierDOI:10.12921/cmst.2013.19.04.229-234
dc.identifierhttp://hdl.handle.net/20.500.12661/2597
dc.identifier.urihttp://hdl.handle.net/20.500.12661/2597
dc.languageen
dc.publisherOWN Poznan Supercomputing and Networking Center
dc.subjectSPRT
dc.subjectCUSUM
dc.subjectControl chart
dc.subjectARL
dc.subjectErlang-truncated exponential distribution
dc.subjectExponential distribution
dc.subjectSequential probability ratio test
dc.subjectAverage run length
dc.subjectCumulative sum
dc.titleOne-sided cumulative sum (CUSUM) control charts for the Erlang-truncated exponential distribution
dc.typeArticle

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