A control chart for time truncated life tests using exponentiated half logistic distribution

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dc.creatorRao, Gadde Srinivasa
dc.date2020-11-25T08:30:51Z
dc.date2020-11-25T08:30:51Z
dc.date2017
dc.date.accessioned2022-10-20T13:09:19Z
dc.date.available2022-10-20T13:09:19Z
dc.descriptionAbstract. Full text article available at http://dx.doi.org/10.18576/amis/120111
dc.descriptionIn this article, an exponentiated half logistic distribution considered to develop an attribute control chart for time truncated life tests with known or unknown shape parameter. The performance of the proposed chart is evaluated in terms of average run length (ARL) using the Monte Carlo simulation. The extensive tables are provided for the industrial use for various values of shape parameter, sample size, specified ARL and shift constants. The advantages of the proposed control chart are discussed over the existing truncated life test control charts. The performance of the proposed control chart is also studied using the simulated data sets for industrial purpose.
dc.identifierRao, S. (2018). A control chart for time truncated life tests using exponentiated half logistic distribution. Applied Mathematics & Information Sciences, 12(1), 125-131.
dc.identifierDOI:10.18576/amis/120111
dc.identifierhttp://hdl.handle.net/20.500.12661/2623
dc.identifier.urihttp://hdl.handle.net/20.500.12661/2623
dc.languageen
dc.publisherNatural Sciences Publishing Cor.
dc.subjectExponentiated half logistic distribution
dc.subjectAttribute control chart
dc.subjectTruncated life test
dc.subjectAverage run length
dc.subjectSimulation
dc.subjectStatistical process control
dc.subjectSPC
dc.subjectControl chart
dc.subjectDistribution
dc.subjectLogistic distribution
dc.titleA control chart for time truncated life tests using exponentiated half logistic distribution
dc.typeArticle

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